Titlebook: MEMS and Nanotechnology, Volume 6; Proceedings of the 2 Gordon A. Shaw,Barton C. Prorok,LaVern A. Starman Conference proceedings 2013 The S

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Sriharsha V. Aradhya,Michael Frei,Mark S. Hybertsen,Latha Venkataraman

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Nathan E. Glauvitz,Ronald A. Coutu Jr.,Peter J. Collins,LaVern A. Starman

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Benjamin Klusemann,Alain Franz Knorr,Horst Vehoff,Bob Svendsen

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Characterizing External Resistive, Inductive and Capacitive Loads for Micro-Switches,ased on the type of load that is being switched, clear characterizations of “hot” switching and “cold” switching external resistive, capacitive, and inductive loads are produced. External resistive loads were found to act as current limiters and should be suitable under certain criteria for reducing

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A Precision Force Microscope for Biophysics,e image signal-to-noise ratio. Finally, we demonstrate atomic-scale (～100 pm) tip-sample stability and registration over tens of minutes with a series of AFM images. The stabilization technique requires low laser power (<1 mW), imparts a minimal perturbation upon the cantilever, and is independent o

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Characterizing Metal Insulator Transition (MIT) Materials for Use as Micro-Switch Elements,e to adjust the resistivity of the material. Therefore, by tailoring the properties of specific portions of a conductor, we were able to control current flow in a circuit without needing a micro-mechanical or a microelectronic device.

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