Titlebook: Low-Power Variation-Tolerant Design in Nanometer Silicon; Swarup Bhunia,Saibal Mukhopadhyay Book 2011 Springer Science+Business Media, LLC

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Power Dissipationd. This chapter covers the basics of the IC power consumption issue. It first investigates the sources of IC power dissipation, and then discusses recent techniques for IC power analysis. Finally, it studies recently proposed power optimization techniques from circuit and physical design to system synthesis.

Ccu106

Low-Power and Variation-Tolerant Application-Specific System Designas power and performance with system level metrics such as quality-of-results and tolerance to variations (yield). The techniques presented in this chapter target various types of designs that include logic and memory architectures and complete DSP systems.

前兆

Eclampsia

Focus-Words

Book 2011c and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

重疊

Statistical Design of Integrated Circuitsst-silicon stage, we then present how a set of compact sensors may be used to predict the delay of a manufactured part, with known confidence, through a small set of measurements on the sensors: such data can then be used to drive adaptive post-silicon tuning approaches that are individualized to each manufactured part.

發(fā)起

Low-Power and Variation-Tolerant Memory Designit techniques, post silicon adaptive repair techniques, and variation-tolerant SRAM peripherals. A self-repairing SRAM is discussed which adaptively adjusts its body bias to improve its reliability. Finally, a discussion on adaptive low-power and variation-tolerant SRAM design for multi-media applications is provided.

難解

Variation and Aging Tolerance in FPGAs the ability to spread wear effects over the chip which is not possible in ASICs. This chapter examines the impact of variation and wear on FPGAs and notes the benefit that can be gained from variation and aging tolerance techniques that operate open-loop.

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