Titlebook: Long-Term Reliability of Nanometer VLSI Systems; Modeling, Analysis a Sheldon Tan,Mehdi Tahoori,Saman Kiamehr Book 2019 Springer Nature Swi

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Compact EM Models for Multi-Segment Interconnect Wirestraight-line structure investigated in reliability analysis. However, obtaining analytical solutions for electromigration-induced stress evolution in general interconnect structure is extremely difficult (if not impossible).