Titlebook: Kelvin Probe Force Microscopy; From Single Charge D Sascha Sadewasser,Thilo Glatzel Book 2018 Springer International Publishing AG, part of

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Kelvin Probe Force Microscopy978-3-319-75687-5Series ISSN 0931-5195 Series E-ISSN 2198-4743

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Sascha Sadewasser,Thilo GlatzelDiscusses the applications of Kelvin probe force microscopy in nanotechnology.Provides a detailed description of a variety of theoretical and experimental aspects of the technique.Includes contributio

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Springer Series in Surface Scienceshttp://image.papertrans.cn/k/image/542372.jpg

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https://doi.org/10.1007/978-3-319-75687-5Scanning Kelvin Probe Microscopy; Electrostatic Force Microscopy; KPFM techniques for liquid environme

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Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in Liquents and describe what other information can be obtained. Finally, we discuss potential applications and limitations of existing approaches and present possible solutions for the successful implementation of liquid KPFM.

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Book 2018ume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics..It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field..

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