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Titlebook: Kategorien I; H. Schubert Textbook 1970 Springer-Verlag Berlin · Heidelberg 1970 Algebra.Beweis.Kategorie (Math.).Kategorien.Kategorienthe

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21#
發(fā)表于 2025-3-25 06:42:29 | 只看該作者
H. Schuberto post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
22#
發(fā)表于 2025-3-25 09:04:05 | 只看該作者
23#
發(fā)表于 2025-3-25 13:34:06 | 只看該作者
o post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
24#
發(fā)表于 2025-3-25 16:51:49 | 只看該作者
25#
發(fā)表于 2025-3-25 20:02:56 | 只看該作者
H. SchubertReduced Ordered Binary Decision Diagrams(ROBDDs), data structures that provide compact representations formany Boolean functions occurring in practical applications. We havenow seen the development of algorithms for functional decompositionwhich work directly based on ROBDDs, so that the decompositi
26#
發(fā)表于 2025-3-26 02:14:47 | 只看該作者
H. SchubertReduced Ordered Binary Decision Diagrams(ROBDDs), data structures that provide compact representations formany Boolean functions occurring in practical applications. We havenow seen the development of algorithms for functional decompositionwhich work directly based on ROBDDs, so that the decompositi
27#
發(fā)表于 2025-3-26 06:54:09 | 只看該作者
H. Schubertwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119
28#
發(fā)表于 2025-3-26 12:05:56 | 只看該作者
29#
發(fā)表于 2025-3-26 14:12:00 | 只看該作者
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發(fā)表于 2025-3-26 19:09:28 | 只看該作者
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