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Titlebook: Icephobic Materials for Anti/De-icing Technologies; Yizhou Shen Book 2024 The Editor(s) (if applicable) and The Author(s), under exclusive

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樓主: purulent
11#
發(fā)表于 2025-3-23 13:30:52 | 只看該作者
12#
發(fā)表于 2025-3-23 14:00:23 | 只看該作者
Xu Fu,Yizhou Shen,Weixin Zhu,Zhaoru He,Weibiao Xiongof pin counts of 1024 pins/chip and higher clock rates. This leads to increased problems with inductance and electrical noise during digital test. For a more comprehensive study of the VLSI testing process,the reader may examine a recent survey article by Grochowski et al. [270] and the books listed
13#
發(fā)表于 2025-3-23 21:55:36 | 只看該作者
Yizhou Shen,Weibiao Xiong,Xu Fu,Weixin Zhu,Linfeng Zhaowhich include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester co
14#
發(fā)表于 2025-3-23 23:51:00 | 只看該作者
Yizhou Shen,Zhaoru He,Xinyu Xie,Zhengwei Wu,Yang Lu,Mingming Jin,Yuehan Xiewhich include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester co
15#
發(fā)表于 2025-3-24 05:14:36 | 只看該作者
Weixin Zhu,Tengfei Xiang,Yizhou Shen,Lingfeng Zhao,Xuefeng Nongof pin counts of 1024 pins/chip and higher clock rates. This leads to increased problems with inductance and electrical noise during digital test. For a more comprehensive study of the VLSI testing process,the reader may examine a recent survey article by Grochowski et al. [270] and the books listed
16#
發(fā)表于 2025-3-24 10:24:41 | 只看該作者
Weixin Zhu,Yingxuan Jia,Yizhou Shen,Xu Fu,Zhaoru Heof pin counts of 1024 pins/chip and higher clock rates. This leads to increased problems with inductance and electrical noise during digital test. For a more comprehensive study of the VLSI testing process,the reader may examine a recent survey article by Grochowski et al. [270] and the books listed
17#
發(fā)表于 2025-3-24 12:21:33 | 只看該作者
18#
發(fā)表于 2025-3-24 18:41:19 | 只看該作者
19#
發(fā)表于 2025-3-24 20:37:15 | 只看該作者
Enqi Zhou,Yizhou Shen,Aituhan Yeerken,Jiawei Jiang,Xuefeng Nongcase scenarios and multiple choice review questions. Full-color figures and diagrams enhance and extend the content.?.Perfect for in-class reference or board licensing review, .Essentials of Endocrinology and Metabolism?.is an indispensable resource for medical and nursing students alike..978-3-030-39571-1978-3-030-39572-8
20#
發(fā)表于 2025-3-24 23:43:49 | 只看該作者
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