Titlebook: Intuitive Combinatorial Topology; V. G. Boltyanski?,V. A. Efremovich Textbook 2001 Springer Science+Business Media New York 2001 Algebraic

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Compact Modeling of BTI for Circuit Reliability Analysis,s to develop compact models of BTI when the stress voltage is varying. The results cover the underlying physics of two leading mechanisms, Reaction–Diffusion (R–D) and Trapping/Detrapping (T–D). Moreover, silicon validation of these models is performed at 45 and 65 nm technology nodes, at both devic

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The structure of sucrose in the crystal and in solution,ientation of all the constituting atoms. Needless to stress that such a knowledge is of fundamental importance for the basic understanding of the molecular properties and functions. The evolution of the concept of structure has been parallel to the progress in structural chemistry. Obviously, the fi

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