Titlebook: International Youth Conference on Electronics, Telecommunications and Information Technologies; Proceedings of the Y Elena Velichko,Maksim

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書目名稱International Youth Conference on Electronics, Telecommunications and Information Technologies讀者反饋學(xué)科排名

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Investigation of Selectivity and Reproducibility Characteristics of Gas Capacitive MIS Sensorsre than 90% of suitable MIS structures after forming gas annealing (40?h at T.?=?130?℃ in a medium of 2% vol.d. H.?+?air) have limit of hydrogen detection 150?±?75?ppb and characteristic response times to supply and removal of 5?ppm H. τ.?=?5?±?3?min and τ.?=?8?±?5?min, respectively. It is shown tha

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SOI Based Micro-Bead Catalytic Gas Sensorr Thermocatalytic Sensors manufactured with SOI (silicon on insulator) technology can be functional at temperatures below 600?℃ with the power consumption in a range of 20–50?mW. The current aim of researches is the elaboration of novel sensor processing and development of nanostructured catalyst la

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Formation of Functional Conductive Carbon Coating on Si by C60 Ion Beamthe substrate-coating interface due to the ion-beam mixing effect, which results in a good adhesion of the coating. Electric resistivity of coating obtained with 8?keV ions at .?=?400?℃ is 1.5?×?10.?Ω?×?m, whereas 5?keV ions at same .?=?400?℃ gives 9?×?10.?Ω?×?m.

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bility theory, Markov processes, mathematical physics and spectrum theory, this book will be a welcome introduction to a growing area of research. .978-1-84996-938-3978-1-84628-123-5Series ISSN 1431-7028

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BACLE

Oleg I. Louksha,Pavel A. Trofimov,Vladimir N. Manuilov,Mikhail Yu. Glyavinbility theory, Markov processes, mathematical physics and spectrum theory, this book will be a welcome introduction to a growing area of research. .978-1-84996-938-3978-1-84628-123-5Series ISSN 1431-7028

Omniscient

Alexey S. Podstrigaev,Andrey V. Smolyakov,Igor V. Maslovbility theory, Markov processes, mathematical physics and spectrum theory, this book will be a welcome introduction to a growing area of research. .978-1-84996-938-3978-1-84628-123-5Series ISSN 1431-7028