Titlebook: Integrated Time-Based Signal Processing Circuits for Harsh Radiation Environments; Arijit Karmakar,Valentijn De Smedt,Paul Leroux Book 202

oxidant

Integrated Time-Based Signal Processing Circuits for Harsh Radiation Environments978-3-031-40620-1Series ISSN 2690-0300 Series E-ISSN 2690-0327

FICE

https://doi.org/10.1007/978-3-031-40620-1Ionizing Radiation on ICs; Time-based Signal Processing; Rad-hard IC design; Ionizing Radiation Sensors

RACE

Fundamentals of Ionizing Radiation,ion-induced hole trapping has gone down. Also, the generation of interface trap charges has decreased notably due to electron tunneling [23], and subsequent neutralization of holes [24]. On the other hand, for scaled-down CMOS technologies, the critical charge required to cause a SEE has reduced sig

內(nèi)行

Basics of Time-Based Signal Processing,ipations to meet performance requirements. There has been an increased interest in finding alternatives to traditional voltage-based signal processing as it is mainly dependent on power-hungry area inefficient operational-transconductance amplifiers OTAs. A viable emerging alternative is time-based

offense

Radiation Assessment of Quadrature LC Oscillators,setup of the TID experiment is discussed, and the results obtained are statistically analyzed in this chapter to perform a comparative study of the performance of the two different QVCOs and evaluate the effectiveness of the RHBD techniques employed in the implementations. The rest of the chapter is

防水

Celiac-Plexus

CYT

Conclusion,to destructive phenomena like SEL and SEGR. The research was conducted with the end goal of finding practical applications in a variety of harsh radiation environments. Some examples of these environments include high-energy physics experiments, critical long-term space missions, and future nuclear-

背叛者

啤酒