Titlebook: Help me even herinneren; Een gids voor mensen Liesbeth Joosten,Sanne Berg,Jan-Pieter Teunisse Book 2008Latest edition Bohn Stafleu van Logh

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lytical approaches to test efficiently the severity of electThis monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era

細(xì)絲

Liesbeth Joosten,Sanne van den Berg,Jan-Pieter Teunisselytical approaches to test efficiently the severity of electThis monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era

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Liesbeth Joosten,Sanne van den Berg,Jan-Pieter Teunissecircuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are bec

jeopardize

Liesbeth Joosten,Sanne van den Berg,Jan-Pieter Teunisselytical approaches to test efficiently the severity of electThis monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era

lymphoma

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