| 書目名稱 | Handbook of Practical X-Ray Fluorescence Analysis | | 編輯 | Burkhard Beckhoff,habil. Birgit Kanngie?er,Helmut | | 視頻video | http://file.papertrans.cn/422/421980/421980.mp4 | | 概述 | The most comprehensive and latest core reference in this field.Makes it a must for all the analytical laboratories and individual analysts because of its user orientation.Includes supplementary materi | | 圖書封面 |  | | 描述 | X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of thes | | 出版日期 | Book 2006 | | 關(guān)鍵詞 | Element analysis; Heavy metals; KLT; KLTcatalog; PES; Process control; REM; Trace element analysis; X-ray fl | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-540-36722-2 | | isbn_softcover | 978-3-662-49601-5 | | isbn_ebook | 978-3-540-36722-2 | | copyright | Springer-Verlag Berlin Heidelberg 2006 |
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