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Titlebook: Handbook of Microscopy for Nanotechnology; Nan Yao,Zhong Lin Wang Book 2005 Springer-Verlag US 2005 crystallography.electron microscope.mi

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發(fā)表于 2025-3-21 16:43:11 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱Handbook of Microscopy for Nanotechnology
編輯Nan Yao,Zhong Lin Wang
視頻videohttp://file.papertrans.cn/422/421661/421661.mp4
概述Written by experts in the field.Provides thorough treatment of the most appropiate microscopy techniques of importance to studying nanostructured materials.Includes supplementary material:
圖書(shū)封面Titlebook: Handbook of Microscopy for Nanotechnology;  Nan Yao,Zhong Lin Wang Book 2005 Springer-Verlag US 2005 crystallography.electron microscope.mi
描述.Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolu
出版日期Book 2005
關(guān)鍵詞crystallography; electron microscope; microscopy; nanostructure; nanotechnology; scanning electron micros
版次1
doihttps://doi.org/10.1007/1-4020-8006-9
isbn_ebook978-1-4020-8006-7
copyrightSpringer-Verlag US 2005
The information of publication is updating

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High Resolution Transmission Electron Microscopynmental electron microscopy are likely areas of concentrated activity. Many challenges remain. The differences between simulated and experimental contrast levels need to be fully explained. Better approaches to inversion of crystal scattering are needed. Operating conditions for aberration-corrected
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Environmental Transmission Electron Microscopy in Nanotechnologyined as a function of nanoparticles size. The ETEM can also be used to perform . synthesis of nanophase materials. The simultaneous characterization can be performed during synthesis allowing synthesis conditions to be varied and optimized rapidly. Sub-nanometer electron probes can also permit nano-
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Confocal Scanning Optical Microscopy and Nanotechnology
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Visualization of Nanostructures with Atomic Force Microscopy
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Scanning Probe Microscopy for Nanoscale Manipulation and Patterning
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ctron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolu978-1-4020-8006-7
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