| 書目名稱 | From scientific instrument to industrial machine | | 副標(biāo)題 | Coping with architec | | 編輯 | Richard Doornbos,Sjir van Loo | | 視頻video | http://file.papertrans.cn/350/349018/349018.mp4 | | 概述 | Condensed knowledge, relatively easily applicable in other contexts.Explains the type of problems without diving into details.Provides examples of how to address analogous problems in different domain | | 叢書名稱 | SpringerBriefs in Electrical and Computer Engineering | | 圖書封面 |  | | 描述 | .Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In .From scientific instrument to industrial machine,. we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions..From scientific instrument to industrial machine. takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this co | | 出版日期 | Book 2012 | | 關(guān)鍵詞 | Electron Microscope; Microprocessor design; Systems Architecting; Systems Engineering; embedded systems | | 版次 | 1 | | doi | https://doi.org/10.1007/978-94-007-4147-8 | | isbn_softcover | 978-94-007-4146-1 | | isbn_ebook | 978-94-007-4147-8Series ISSN 2191-8112 Series E-ISSN 2191-8120 | | issn_series | 2191-8112 | | copyright | The Author(s) 2012 |
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