| 書目名稱 | Field Emission Scanning Electron Microscopy |
| 副標(biāo)題 | New Perspectives for |
| 編輯 | Nicolas Brodusch,Hendrix Demers,Raynald Gauvin |
| 視頻video | http://file.papertrans.cn/343/342583/342583.mp4 |
| 概述 | Includes supplementary material: |
| 叢書名稱 | SpringerBriefs in Applied Sciences and Technology |
| 圖書封面 |  |
| 描述 | .This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage. |
| 出版日期 | Book 2018 |
| 關(guān)鍵詞 | Field emission gun technologies; Ionic liquid treatment; Dual in-lens electron detection; Low voltage S |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-981-10-4433-5 |
| isbn_softcover | 978-981-10-4432-8 |
| isbn_ebook | 978-981-10-4433-5Series ISSN 2191-530X Series E-ISSN 2191-5318 |
| issn_series | 2191-530X |
| copyright | The Author(s) 2018 |
|Archiver|手機版|小黑屋|
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