| 書目名稱 | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |
| 編輯 | Alfredo Benso,Paolo Prinetto |
| 視頻video | http://file.papertrans.cn/342/341481/341481.mp4 |
| 叢書名稱 | Frontiers in Electronic Testing |
| 圖書封面 |  |
| 描述 | .Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation. intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance. |
| 出版日期 | Book 2003 |
| 關(guān)鍵詞 | FPGA; Field Programmable Gate Array; RAM; SRAM; Software; VHDL; computer-aided design (CAD); embedded syste |
| 版次 | 1 |
| doi | https://doi.org/10.1007/b105828 |
| isbn_softcover | 978-1-4419-5391-9 |
| isbn_ebook | 978-0-306-48711-8Series ISSN 0929-1296 |
| issn_series | 0929-1296 |
| copyright | Springer Science+Business Media New York 2003 |
|Archiver|手機(jī)版|小黑屋|
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