Titlebook: Emerging VLSI Devices, Circuits and Architectures; Proceedings of the 2 Anu Gupta,Jai Gopal Pandey,Devesh Dwivedi Conference proceedings 20

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https://doi.org/10.1007/978-981-99-1858-4s. This also enables designers to analyze different result reports and fix issues accordingly. This algorithm ensures that standard cells are clean by construction for pin accessibility during the library development phase itself.

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1876-1100 Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design..978-981-97-8383-0978-981-97-5269-0Series ISSN 1876-1100 Series E-ISSN 1876-1119

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https://doi.org/10.1007/978-1-61779-989-1-Digital converter (TDC) under test. This circuit technique avoids the use of costly sophisticated instruments which are required for the measurement of high-speed clocks. The time resolution, i.e. 5 ps is verified using input clocks at 25 MHz.

PACT

https://doi.org/10.1007/978-1-4899-3668-4?.C to 125?.C. The design also includes the current trimming feature through an external resistor to cater to the requirements of different types of thermistors. The circuit has been designed using a 0.18?.m CMOS process.

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A Low Jitter and High-Speed Flash TDC with PVT Calibration and Its Testing Methodology,-Digital converter (TDC) under test. This circuit technique avoids the use of costly sophisticated instruments which are required for the measurement of high-speed clocks. The time resolution, i.e. 5 ps is verified using input clocks at 25 MHz.

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,High-Precision Programmable Thermistor Linearization ASIC for?Electro-Optical Payload Applications,?.C to 125?.C. The design also includes the current trimming feature through an external resistor to cater to the requirements of different types of thermistors. The circuit has been designed using a 0.18?.m CMOS process.