Titlebook: Equilibrium Structure and Properties of Surfaces and Interfaces; A. Gonis,G. M. Stocks Book 1992 Springer Science+Business Media New York

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Volume and Interfacial Properties of Metal/Rare Earth Oxide/Metal Structures,e the reason that they are considered as dielectric materials for thin-film (TF) capacitors, TF transistors (MOSFET) and TF electroluminescent devices. Different preparation methods have been employed to produce TFREMO..

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Book 1992nderstanding of materials properties. If one is to have any hope of understanding such properties as catalysis, microelectronic devices and contacts, wear, lubrication, resistance to corrosion, ductility, creep, intragranular fracture, toughness and strength of steels, adhesion of protective oxide s

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Olivier Michel,Florent Jacquemardly scattered by condensed matter and so the results can then mostly be interpreted in terms of the kinematical theory of X-ray diffraction. This leads to easier and less unambiguous interpretation of the experimental results.

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Shivom Sharma,S. R. Nabavi,G. P. Rangaiahthe last several years, a group of similar approaches have been developed for this purpose which represent a substantial improvement over previous approximations such as pair potential interaction models. In this article, these new approaches will be summarized and some illustrative examples of their use will be described.