Titlebook: Embedded Processor-Based Self-Test; Dimitris Gizopoulos,Antonis Paschalis,Yervant Zori Book 2004 Springer Science+Business Media New York

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https://doi.org/10.1007/978-1-84628-784-8The problem of testing complex SoC architectures has attracted researchers’ interest the recent years because it is a problem of increasing difficulty and importance for the electronic circuits development community.

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https://doi.org/10.1007/978-1-4020-2801-4SoC; automation; development; diagnosis; integrated circuit; logic; microcontroller; microprocessor; tables

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Mengen – Relationen – Funktionen, multi-functional and high-performance electronic systems. According to the prediction of the 2003 International Technology Roadmap for Semiconductors (ITRS) [76], by year 2018 the half pitch. of dynamic random access memories (DRAM), microprocessors and application-specific ICs (ASIC) will drop to