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Titlebook: Embedded Memory Design for Multi-Core and Systems on Chip; Baker Mohammad Book 2014 Springer Science+Business Media New York 2014 Analog C

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發(fā)表于 2025-3-26 23:25:53 | 只看該作者
978-1-4939-4801-7Springer Science+Business Media New York 2014
32#
發(fā)表于 2025-3-27 04:58:56 | 只看該作者
33#
發(fā)表于 2025-3-27 08:53:59 | 只看該作者
Baker MohammadProvides a comprehensive overview of embedded memory design and associated challenges and choices.Explains tradeoffs and dependencies across different disciplines involved with multi-core and system o
34#
發(fā)表于 2025-3-27 13:17:33 | 只看該作者
Analog Circuits and Signal Processinghttp://image.papertrans.cn/e/image/307906.jpg
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發(fā)表于 2025-3-27 14:54:15 | 只看該作者
Introduction,owever, embedded memories can negatively impact area, power, timing, yield, and design time. The ever-increasing gap between processor frequencies and DRAM access times, popularly referred to as memory wall, has indicated that processors use more and more on-die memory, hence the name “Embedded memo
36#
發(fā)表于 2025-3-27 20:00:24 | 只看該作者
Cache Architecture and Main Blocks,ure. Since TCM is a simpler version of cache, in this book we will concentrate on cache design. Cache architecture is normally led by the micro architecture team with strong input from circuit design and process technology. Circuit design input provides area, access time, and power for a given cache
37#
發(fā)表于 2025-3-27 22:24:20 | 只看該作者
Embedded Memory Hierarchy,capacity [35, 54]. The smaller the size the faster the access time is. This is true because there is less entry to search through and there is less area for signal to propagate to the execution unites. In addition, the number of multiplexer to select the data is less for smaller memory size. Bigger
38#
發(fā)表于 2025-3-28 05:52:20 | 只看該作者
39#
發(fā)表于 2025-3-28 09:25:57 | 只看該作者
Power and Yield for SRAM Memory,bust and stable. In addition to these factors, controlling variability through process technology further reduces the device parameter shift. The SRAM cell stability and its effect on both yield and power have been addressed through several techniques, and they are as follows:
40#
發(fā)表于 2025-3-28 10:37:11 | 只看該作者
Leakage Reduction,Leakage current (i.e., the current flowing through the device during its “off” state) has increased drastically with technology scaling [63, 64]. Leakage minimization in standby mode is important for chips in general, but is critical for handhelds and mobile phones because such products have long id
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