Titlebook: Ellipsometry of Functional Organic Surfaces and Films; Karsten Hinrichs,Klaus-Jochen Eichhorn Book 20141st edition Springer-Verlag Berlin

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Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Sonic films, from a few Angstroms to a few micrometers in thickness, at the solid-liquid interface. Because of their different working principles, both techniques are highly complementary, providing insight into optical and mechanical properties, respectively. The combination of SE and QCM-D in one se

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In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates, Organic Light Emitting Diodes—OLEDs, etc.) is the quality control of the substrates, active layers, barrier materials and transparent electrode nanolayers that are used for the fabrication of these devices. The in-line optical characterization and modeling of the optical and electrical properties

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0931-5195 ng techniques.Is oriented towards the high technological intEllipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of

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Polymer Brushes, Hydrogels, Polyelectrolyte Multilayers: Stimuli-Responsivity and Control of Protein of solution parameters summarized. In-situ IR-ellipsometry provides information about changes in the vibration band structure for swelling and adsorption processes, where optical modeling in the IR-range yields complementary information about layer thicknesses and structural properties.

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Book 20141st editionction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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