Titlebook: Electrothermal Analysis of VLSI Systems; Yi-Kan Cheng,Ching-Han Tsai,Sung-Mo Steve Kang Book 2002 Springer Science+Business Media New York

hedonist

書目名稱Electrothermal Analysis of VLSI Systems影響因子(影響力)




書目名稱Electrothermal Analysis of VLSI Systems影響因子(影響力)學科排名




書目名稱Electrothermal Analysis of VLSI Systems網(wǎng)絡公開度




書目名稱Electrothermal Analysis of VLSI Systems網(wǎng)絡公開度學科排名




書目名稱Electrothermal Analysis of VLSI Systems被引頻次




書目名稱Electrothermal Analysis of VLSI Systems被引頻次學科排名




書目名稱Electrothermal Analysis of VLSI Systems年度引用




書目名稱Electrothermal Analysis of VLSI Systems年度引用學科排名




書目名稱Electrothermal Analysis of VLSI Systems讀者反饋




書目名稱Electrothermal Analysis of VLSI Systems讀者反饋學科排名

欺騙手段

Book 2002ectrothermal analysis including temperature-dependentelectromigration diagnosis, cell-level thermal placement andtemperature-driven power and timing analysis. ..Electrothermal Analysis of VLSI Systems. will be useful forresearchers in the fields of IC reliability analysis and physicaldesign, as well as VLSI designers and graduate students.

Lipoma

lectrothermal phenomena andthe fundamental building blocks that electrothermal simulationrequires (including power analysis, temperature-dependent devicemodeling, thermal/electrothermal simulation, and experimentalsetup-calibration). .Part II, The Applications, discusses three important applications

indoctrinate

LEVER

Blatant

Blatant

978-1-4757-7373-6Springer Science+Business Media New York 2002

CHIP

Expediency

Analysis and Assessment of BEO-Doped Fuel with Fuel Rod Performance Code Jasmine, fuel is performed respectively. Based on the experiment data from the Halden reactor, the results show that the predictions calculated by updated JASMINE are in good agreement with the measurements, demonstrating an excellent ability to analyze the in-pile behavior of UO.-BeO fuel.

Jingoism