Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; Ray F. Egerton Book 1995 Springer-Verlag US 1995 Energy-dispersive X-ray spe

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Applications of Energy-Loss Spectroscopy,In this final chapter, we discuss how the instrumentation, theory and techniques described earlier are used to obtain practical information from electron-microscope specimens. The general sequence will be: low-loss spectroscopy, core-loss spectroscopy, energy-filtered imaging, and analysis of fine structure in the energy-loss spectrum.

Debrief

https://doi.org/10.1007/978-1-4615-6887-2Energy-dispersive X-ray spectroscopy; X-ray spectroscopy; electron optics; spectra; spectroscopy

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Springer-Verlag US 1995

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https://doi.org/10.1007/978-3-658-18683-8itted through a thin specimen rather than being brought to rest and absorbed. We begin this introduction with a simplified account of the physical processes which occur while these “fast” electrons are passing through the specimen.

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,Die Werkst?tte des Arztes (κατ’ ?ητρε?ον),s a function of position (specified by coordinates . and .) on the specimen, as a function of the coordinates of angular deflection . and ., and as a function of energy loss .. Even if such a procedure were technically feasible, it would involve storing a very large amount of data, so in practice an

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,Vom ?rztlichen Anstand (π?ρì ?ùσχημοσúνη?),on an empirical basis, the term “elastic” being taken to mean that the energy loss to the sample is less than some experimental resolution limit Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an

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Annette Soehnle,Sabine Lamprechtcal composition of a specimen. Although this information is expressed fairly directly in the energy-loss spectrum, plural scattering complicates the data recorded from specimens of typical thickness. It is therefore desirable to remove the effects of plural scattering from the spectrum or at least m

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Electron Scattering Theory,a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is usually not better than 1 eV.

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