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Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; R. F. Egerton Book 19962nd edition Springer Science+Business Media New York

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發(fā)表于 2025-3-21 17:11:43 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Electron Energy-Loss Spectroscopy in the Electron Microscope
編輯R. F. Egerton
視頻videohttp://file.papertrans.cn/307/306109/306109.mp4
圖書封面Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope;  R. F. Egerton Book 19962nd edition Springer Science+Business Media New York
描述to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec- troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev- eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re- searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi- cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones
出版日期Book 19962nd edition
關(guān)鍵詞Analytical Electron Microscopy book; EELS materials science book; Inelastic scattering of electrons; co
版次2
doihttps://doi.org/10.1007/978-1-4757-5099-7
isbn_ebook978-1-4757-5099-7
copyrightSpringer Science+Business Media New York 1996
The information of publication is updating

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Surgical Anatomy of the Hip Joint,rion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is rarely better than 0.5 eV.
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Book 19962nd editionctron energy-loss spec- troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev- eral types of energy-filtering microscope are now available
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Hip-Hop Revolution in the Fleshf these techniques have been used to investigate particular problems in materials science and biology. Table 5.1 summarizes the various types of information obtainable by EELS and by alternative high-resolution methods.
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Instrumentation for Energy-Loss Spectroscopy, if technically feasible, such a procedure would involve storing a vast amount of information, so in practice the acquisition of energy-loss data is restricted to the following categories (see Fig. 2.1).
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Electron Scattering Theory,rion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electron microscope, where the energy resolution is rarely better than 0.5 eV.
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https://doi.org/10.1007/978-1-4757-5099-7Analytical Electron Microscopy book; EELS materials science book; Inelastic scattering of electrons; co
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