Titlebook: Electron Crystallography; Douglas L. Dorset,Sven Hovm?ller,Xiaodong Zou Book 1997 Springer Science+Business Media Dordrecht 1997 X-ray cry

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GRIEF

HPA533

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An Introduction to Maximum Entropy in Actionles, whereas in the case of macromolecular crystallography, there will be a large set of such phases, albeit rather inaccurately known at times, derived from isomorphous replacement methods. In electron diffraction, the Fourier transform of the corresponding image may give useful phase information.

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起草

Definition, Measurement and Calculation of Intensities in Electron Diffraction experimental techniques: . (SAD), .; . (CBED), and a . — and in relation to calculations. I shall emphasize the need for three-dimensional intensity data, and discuss methods for including or correcting dynamical scattering in connection with structure determination of inorganic materials.

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Crystal Structure Determination by Crystallographic Image Processing: I.,s given of why this is possible and how to obtain structure factor amplitudes and phases from HREM images of weak-phaseobjects. We will also demonstrate how a projected potential map is reconstructed from the amplitudes and phases by Fourier synthesis. More detailed descriptions and explanations can be found in the book by Zou [1].

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Crystal Structure Determination by Crystallographic Image Processing: II. ,ave to be well aligned. Here we will present how to use crystallographic image processing to compensate for distortions caused by noise, defocus, astigmatism and crystal misalignment. The amplitudes and phases after the CTF and crystal tilt correction can be used for crystal structure determination.

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Crystal Structure Determination by Two-Stage Image Processing structure image by image deconvolution [2, 3]. The resolution of such obtained structure image is limited by the resolution of the electron microscope so that not all atoms but usually only heavy atoms can be seen. In the second stage the image resolution is improved by phase extension using the corresponding electron diffraction data [4].