Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B

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Characterization of Deformed Microstructures,olycrystalline microstructures. As this tool was championed by the texture analysis community in the early stages of its application to materials research, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This

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Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium,r tantalum and zirconium is covered in this chapter. The focus will be on the role of microtextural investigations as an integral tool supporting the development and validation of material models that incorporate anisotropic constitutive behavior. Continuum mechanics codes require accurate descripti

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obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for pr

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Romina Posch,Christian Alexander Scherb the limitations with respect to accuracy. Experiments were carried out to measure orientation fields from a silicon single crystal. The orientation dispersion was 1°. Disorientation correlation maps revealed anisotropy in the spatial variation in measured orientation.

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Alexander A. Ignatiev,Alexander V. Lyashenkoere, the EBSD technique has proven to be essential. An example of this is studies of recrystallization where approximately 33% of the papers published in the proceedings of the recent international conference (REX′99, 1999) contain EBSD data.

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Psychosoziale Faktoren der HIV-Infektion,ed as a reference image, or better, that produced by a dedicated forward scattered electron detector. Examples of the use of the camera, image and EBSD data are given to illustrate the Oxford Instruments EBSD system capabilities.