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Titlebook: Economics of Electronic Design, Manufacture and Test; Magdy Abadir,Tony Ambler Book 1994 Springer Science+Business Media New York 1994 ana

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51#
發(fā)表于 2025-3-30 09:25:28 | 只看該作者
52#
發(fā)表于 2025-3-30 13:41:53 | 只看該作者
,Abgrenzung: Bodenschutzrecht — Baurecht,plexity > 100.00 gates). A suitable strategy for error detection as a function of system complexity is identified, and the resulting design flow is described. The statistical control of the design process as a feedback loop to achieve error prevention is demonstrated. Using data from complex project
53#
發(fā)表于 2025-3-30 19:16:22 | 只看該作者
54#
發(fā)表于 2025-3-31 00:01:56 | 只看該作者
Untersuchungen am fertigen Bauwerk,asic test questions have not yet been completely resolved. Since the gap between a good and a bad analog circuit is not always well-defined, extensive tests may result in the rejection of many fault-free ICs. The objective of this article is to propose fuzzy optimization models that can help in the
55#
發(fā)表于 2025-3-31 02:47:12 | 只看該作者
Saldropo: Vom Moor zum Feuchtgebiet minimize the test hardware effort instead of all the test sequences, only a very small subset will be selected such that a simple generation of all necessary test sequences will be ensured. This procedure drastically decreases the storage requirements (about 80%) and therefore distinctly reduces th
56#
發(fā)表于 2025-3-31 08:28:09 | 只看該作者
Frank-Michael Lange,Hellmuth Mohr,Karl Stahrexpensive mistakes is to perform an economic analysis of the alternative courses of action. In most cases this is done, but not always in the right manner or with the necessary amount of detail to make the comparisons meaningful. This article discusses the need for effective cost analysis of test st
57#
發(fā)表于 2025-3-31 11:49:35 | 只看該作者
58#
發(fā)表于 2025-3-31 15:59:28 | 只看該作者
59#
發(fā)表于 2025-3-31 21:11:11 | 只看該作者
Untersuchungen am fertigen Bauwerk, by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently an
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