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Titlebook: Dynamic Processes on Solid Surfaces; Kenzi Tamaru Book 1993 Springer Science+Business Media New York 1993 catalysis.chirality.electrochemi

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發(fā)表于 2025-3-23 11:26:54 | 只看該作者
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發(fā)表于 2025-3-23 15:57:30 | 只看該作者
curs at the most narrow tube. This indicates that the free energy decrease of the reaction will be shared by the rate-determining step. Other steps are nearly at equilibrium because the free energy decrease is very small for the elementary reactions at these steps.
13#
發(fā)表于 2025-3-23 21:13:48 | 只看該作者
,Musikalische Pr?ferenzbildung,s. and Wragg et al.. made it possible to measure the diffusion rate of oxide ions in the typical phases of bismuth molyb-date and to determine the depth of the oxide ion layers which can be involved in the oxidation reaction..
14#
發(fā)表于 2025-3-23 23:15:04 | 只看該作者
Theory of Atomic and Electronic Structure of Surfaces,mechanical physics on surfaces, roles of Monte Carlo simulation and molecular dynamics are increasingly important in analyses of general models as well as of a specific model for a particular surface system.
15#
發(fā)表于 2025-3-24 05:13:39 | 只看該作者
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發(fā)表于 2025-3-24 07:35:09 | 只看該作者
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發(fā)表于 2025-3-24 11:41:16 | 只看該作者
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發(fā)表于 2025-3-24 15:56:19 | 只看該作者
Book 1993tic way, it is certainly not understandable. In such a manner, dynamics yields behavior quite different from statics. When we want to prepare an iron nitride, for example, one of the most orthodox ways is to put iron in a nitrogen atmosphere under pressures higher than the dissociation pressure of t
19#
發(fā)表于 2025-3-24 19:34:10 | 只看該作者
Real-Time Monitoring of Surface Processes by a Novel Form of Low-Energy Ion Scattering,l impact collision ion scattering spectroscopy (CAICISS). CAICISS is useful for monitoring surface processes in real time. In fact, many studies. on real-time structure monitoring of surfaces and shallow interfaces have been made with CAICISS.
20#
發(fā)表于 2025-3-25 03:14:32 | 只看該作者
In Situ Observation of Surface Processes by High-Resolution UHV Electron Microscopy, is often important in material sciences and device engineering. In addition to the microscopy, diffraction analyses give atomic details of the surfaces. The electron microscopy and diffraction, therefore, present information unique from other structure analyzing techniques and particularly give electronic and/or chemical information.
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