Titlebook: Dielectric Breakdown in Gigascale Electronics; Time Dependent Failu Juan Pablo Borja,Toh-Ming Lu,Joel Plawsky Book 2016 The Author(s) 2016

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Theory of Dielectric Breakdown in Nano-Porous Thin Films, presented to describe mechanisms that can result in failure. In addition, it was discussed how such mechanisms can be affected by material properties, fabrication steps, and type of stress. Complex concepts have been reduced to empirical expression and fitting parameters. These methodologies have b

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Reconsidering Conventional Field Acceleration Models,active feature of the model developed in Chap. . rests on its ability to make predictions on dielectric breakdown at low fields from data collected at high fields without needing to use empirical field acceleration formulas. In this chapter, we discuss estimates from the model and compare these with

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