Titlebook: Design, Modeling and Testing of Data Converters; Paolo Carbone,Sayfe Kiaei,Fang Xu Book 2014 Springer-Verlag Berlin Heidelberg 2014 ADC DA

哄笑

書(shū)目名稱Design, Modeling and Testing of Data Converters影響因子(影響力)




書(shū)目名稱Design, Modeling and Testing of Data Converters影響因子(影響力)學(xué)科排名




書(shū)目名稱Design, Modeling and Testing of Data Converters網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱Design, Modeling and Testing of Data Converters網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱Design, Modeling and Testing of Data Converters被引頻次




書(shū)目名稱Design, Modeling and Testing of Data Converters被引頻次學(xué)科排名




書(shū)目名稱Design, Modeling and Testing of Data Converters年度引用




書(shū)目名稱Design, Modeling and Testing of Data Converters年度引用學(xué)科排名




書(shū)目名稱Design, Modeling and Testing of Data Converters讀者反饋




書(shū)目名稱Design, Modeling and Testing of Data Converters讀者反饋學(xué)科排名

兒童

細(xì)頸瓶

Current and Emerging Trends in the Design of Digital-to-Analog Converters. We present an overview of the digital-to-analog conversion process and delve into DAC characterization by outlining different sources of error and metrics used to quantify the DAC performance. A summary of current-steering (CS) DAC topologies and circuit limitations is provided, and we details fou

消滅

Digitally-Based Calibration Techniques for RF , Modulatorsmploys a test tone applied at the input of the quantizer to evaluate the noise transfer function of the . modulator using the capabilities of the Digital Signal Processing (DSP) platform usually available in mixed-mode systems. Once the modulator’s output bit stream is captured, necessary informatio

Critical

Incremental and Extended-Range Data Convertersr of analog samples into a single digital word. Thus, they are a hybrid of Nyquist-rate and noise-shaping (?Σ) ADCs. This makes IDCs useful in applications where very high resolution (16–24 bits) is required, and simple structure and low power are also desirable. By combining the IDC with a serial A

obligation

obligation

Time-to-Digital Converters and techniques for precise measurement of time interval that elapses between two physical events. The main objective of the meters which are used for such purposes is the creation of a numerical representation of the measured time interval with as high accuracy and precision as possible. Since the

Mri485

EVADE

Dynamic Testing of Analog-to-Digital Converters by Means of the Sine-Fitting Algorithms (SFAs). At first the sine-fitting procedure used for the estimation of SIgnal-to-Noise And Distortion ratio (.) and Effective Number Of Bits (.) parameters is described. In the following the expressions for the bias and the standard deviation of the . estimator provided by a SFA are derived. Then,

溝通