Titlebook: Design for AT-Speed Test, Diagnosis and Measurement; Benoit Nadeau-Dostie Book 2000 Springer Science+Business Media New York 2000 developm

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978-1-4757-8291-2Springer Science+Business Media New York 2000

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Design for AT-Speed Test, Diagnosis and Measurement978-0-306-47544-3Series ISSN 0929-1296

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Frontiers in Electronic Testinghttp://image.papertrans.cn/d/image/268619.jpg

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faculty

Book 2000 system design engineers, test engineersand product managers at the silicon level as well as at the board andsystems levels. Designers will see how the implementation of embeddedtest enables simplification of silicon debug and system bring-up. Testengineers will determine how embedded test provides

faculty

Book 2000ime, resources and costs associated with test development,manufacture cost and lifecycle maintenance of their products can besignificantly reduced by designing embedded test in the product. Acomplete design flow and analysis of the impact of embedded test on adesign makes this book a `must read‘ before any DFT is attempted.

摻和

0929-1296 o chip and system design engineers, test engineersand product managers at the silicon level as well as at the board andsystems levels. Designers will see how the implementation of embeddedtest enables simplification of silicon debug and system bring-up. Testengineers will determine how embedded test

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Hierarchical Core Test,rted. Embedded test is an important part in this solution because of its inherent bandwidth scalability, ability to test at speed, and suitability for reuse at the board and system levels. Automation ensures repeatability and predictability of the process to meet time-to-market needs.

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Design for AT-Speed Test, Diagnosis and Measurement