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Titlebook: Design and Testing of Reversible Logic; Ashutosh Kumar Singh,Masahiro Fujita,Anand Mohan Book 2020 Springer Nature Singapore Pte Ltd. 2020

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書目名稱Design and Testing of Reversible Logic
編輯Ashutosh Kumar Singh,Masahiro Fujita,Anand Mohan
視頻videohttp://file.papertrans.cn/269/268609/268609.mp4
概述Covers the current research under design, synthesis, and testing on a single platform.Discusses numerous step-by-step methodologies for each stream.Provides applications of reversible logic to emergin
叢書名稱Lecture Notes in Electrical Engineering
圖書封面Titlebook: Design and Testing of Reversible Logic;  Ashutosh Kumar Singh,Masahiro Fujita,Anand Mohan Book 2020 Springer Nature Singapore Pte Ltd. 2020
描述The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
出版日期Book 2020
關(guān)鍵詞Reversible Logic Circuits; Design & Automation; Design for Testability; Fault Tolerance Computing; Emerg
版次1
doihttps://doi.org/10.1007/978-981-13-8821-7
isbn_softcover978-981-13-8823-1
isbn_ebook978-981-13-8821-7Series ISSN 1876-1100 Series E-ISSN 1876-1119
issn_series 1876-1100
copyrightSpringer Nature Singapore Pte Ltd. 2020
The information of publication is updating

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Hiroshige Inazumi,Shigeichi Hirasawalty area. A limitation for the second testing scheme is that it can only be employed over a specific type of reversible circuit known as Exclusive-Or Sum-Of-Product (ESOP) design. Both the testing techniques have been executed over different benchmark suites and a comparative study with state-of-the
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Fault Models and Test Approaches in Reversible Logic Circuitsted under two extensive classifications to meet the challenge. The methodologies are alleged to coat almost all the faults and their sub kind by exploiting the properties of reversible gates and circuits. The objective is to minimize testing overhead, which can be achieved by reducing the cost metri
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