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Titlebook: Dependability in Electronic Systems; Mitigation of Hardwa Nobuyasu Kanekawa,Eishi H. Ibe,Yutaka Uematsu Book 2011 Springer Science+Business

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發(fā)表于 2025-3-21 18:09:31 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Dependability in Electronic Systems
副標題Mitigation of Hardwa
編輯Nobuyasu Kanekawa,Eishi H. Ibe,Yutaka Uematsu
視頻videohttp://file.papertrans.cn/266/265693/265693.mp4
概述Provides a set of valuable techniques to design dependability into embedded systems;.Describes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applicatio
圖書封面Titlebook: Dependability in Electronic Systems; Mitigation of Hardwa Nobuyasu Kanekawa,Eishi H. Ibe,Yutaka Uematsu Book 2011 Springer Science+Business
描述This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples.Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
出版日期Book 2011
關鍵詞Dependability in devices; Design for reliability; EMI; Electromagnetic Interference; Fault tolerance; Mic
版次1
doihttps://doi.org/10.1007/978-1-4419-6715-2
isbn_softcover978-1-4899-8594-1
isbn_ebook978-1-4419-6715-2
copyrightSpringer Science+Business Media, LLC 2011
The information of publication is updating

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Durkheim and the Study of Suicidewitches, blockade, and interlocking systems in addition to traffic lights. It is still new in our memory that the computer systems for spaceship Apollo played a very important role in order to bring human being to the moon for the first time in history.
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https://doi.org/10.1007/978-3-030-75158-6temperature instability (NBTI) [2], short-channel effect [3], gate leakage [4], and so on. Terrestrial neutron-induced single-event upset (SEU) is one of such key issues that can be a major setback in scaling.
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Durkheim and the Study of Suicides do. Electromagnetic compatibility (EMC) is defined as the ability of a device, equipment, or system to function satisfactorily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to anything in that environment [1].
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Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigatemperature instability (NBTI) [2], short-channel effect [3], gate leakage [4], and so on. Terrestrial neutron-induced single-event upset (SEU) is one of such key issues that can be a major setback in scaling.
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