Titlebook: Debug Automation from Pre-Silicon to Post-Silicon; Mehdi Dehbashi,G?rschwin Fey Book 2015 Springer International Publishing Switzerland 20

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Brain-Imaging

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Medienethnografische Forschung im Feldegrate large multiprocessor SoCs [BM02, PGI.05]. Having a large SoC with complex communication among its cores, the complete verification coverage at pre-silicon stage is almost impossible. Therefore in addition to electrical bugs, some design bugs may also appear in the final prototype of an SoC.

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https://doi.org/10.1007/978-3-658-25220-5 to time-to-market constraints, 100?% verification coverage at the design level is an elusive task. Consequently, automated debugging approaches are required at both pre-silicon and post-silicon stages in order to reduce the development time of IC products.

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978-3-319-35610-5Springer International Publishing Switzerland 2015

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https://doi.org/10.1007/978-3-531-91774-0rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct design of VLSI circuits is crucial.

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Das Mikroskop und seine Anwendungogic bugs [SVAV05, CMB07b, SFD10, SFB.09]. Algorithmic bugs often have a severe impact on the correctness of a design. Multiple major modifications are usually required to fix algorithmic bugs. Synchronization bugs are related to synchronization of data with respect to clock cycles in a design.

apropos

Medienethnografische Forschung im Feldegrate large multiprocessor SoCs [BM02, PGI.05]. Having a large SoC with complex communication among its cores, the complete verification coverage at pre-silicon stage is almost impossible. Therefore in addition to electrical bugs, some design bugs may also appear in the final prototype of an SoC.

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