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Titlebook: Cryptographic Hardware and Embedded Systems -- CHES 2011; 13th International W Bart Preneel,Tsuyoshi Takagi Conference proceedings 2011 Int

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21#
發(fā)表于 2025-3-25 07:10:35 | 只看該作者
Tom Short,Tom Stehlik,Janene Piip-box is typically in the range of one order of magnitude (in terms of “number of traces to recover the key”). They also confirm the importance of a profiled information theoretic analysis for the worst-case security evaluation of leaking devices. They finally raise the important question whether dua
22#
發(fā)表于 2025-3-25 09:45:21 | 只看該作者
23#
發(fā)表于 2025-3-25 14:27:17 | 只看該作者
Mathematical and Cryptological Background,0 faults and its complexity is around 2. in time and memory, an improvement allows only 5 faults and its complexity in memory is reduced to 2. while the second one requires either 1000 or 45 faults depending on fault model and recovers the secret key in around 2. in time and memory.
24#
發(fā)表于 2025-3-25 18:38:25 | 只看該作者
Information Theoretic and Security Analysis of a 65-Nanometer DDSLL AES S-Box-box is typically in the range of one order of magnitude (in terms of “number of traces to recover the key”). They also confirm the importance of a profiled information theoretic analysis for the worst-case security evaluation of leaking devices. They finally raise the important question whether dua
25#
發(fā)表于 2025-3-25 23:25:14 | 只看該作者
26#
發(fā)表于 2025-3-26 00:13:36 | 只看該作者
Meet-in-the-Middle and Impossible Differential Fault Analysis on AES0 faults and its complexity is around 2. in time and memory, an improvement allows only 5 faults and its complexity in memory is reduced to 2. while the second one requires either 1000 or 45 faults depending on fault model and recovers the secret key in around 2. in time and memory.
27#
發(fā)表于 2025-3-26 04:26:12 | 只看該作者
Bart Preneel,Tsuyoshi TakagiUp-to-date results.Fast-track conference proceedings.State-of-the-art research
28#
發(fā)表于 2025-3-26 10:38:56 | 只看該作者
29#
發(fā)表于 2025-3-26 16:01:55 | 只看該作者
Cryptographic Hardware and Embedded Systems -- CHES 2011978-3-642-23951-9Series ISSN 0302-9743 Series E-ISSN 1611-3349
30#
發(fā)表于 2025-3-26 20:44:59 | 只看該作者
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