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Titlebook: Crucial Issues in Semiconductor Materials and Processing Technologies; S. Coffa,F. Priolo,J. M. Poate Book 1992 Springer Science+Business

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31#
發(fā)表于 2025-3-26 21:58:43 | 只看該作者
32#
發(fā)表于 2025-3-27 02:33:25 | 只看該作者
978-94-010-5203-0Springer Science+Business Media Dordrecht 1992
33#
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34#
發(fā)表于 2025-3-27 09:55:58 | 只看該作者
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發(fā)表于 2025-3-27 17:14:55 | 只看該作者
nce. Under certain excitation conditions strong interwell effects appear, in spite of the thick barriers. These effects seem to be attributable to interface and near-interface defects located in the MBE-grown AlGaAs barriers.
36#
發(fā)表于 2025-3-27 20:04:43 | 只看該作者
The History of Rope Transportation, (DLTS) and current-voltage (IV) measurements. For both undecorated and Fe-decorated stacking faults similar deep level spectra were found with a dominant level at Ev+0.5 eV. For diodes with decorated stacking faults the IV-measurements reveal a drastic enhancement of the reverse current which correlates with the Fe concentration.
37#
發(fā)表于 2025-3-28 00:07:38 | 只看該作者
Scaling for Convective Boundary Layers gradient. This defect configuration shows persistent photoionisation and it is associated with the so-called “DX-center”. The time constant of the relaxation from the substitutional donor-site to the DX-center defect site is measured.
38#
發(fā)表于 2025-3-28 03:19:29 | 只看該作者
39#
發(fā)表于 2025-3-28 07:12:32 | 只看該作者
Effects of Near-Interface Defects on the Optical Properties of MBE Grown GaAs/AlGaAs Layersnce. Under certain excitation conditions strong interwell effects appear, in spite of the thick barriers. These effects seem to be attributable to interface and near-interface defects located in the MBE-grown AlGaAs barriers.
40#
發(fā)表于 2025-3-28 11:58:16 | 只看該作者
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