| 書目名稱 | Computer Vision for Electronics Manufacturing | | 編輯 | L. F. Pau | | 視頻video | http://file.papertrans.cn/235/234079/234079.mp4 | | 叢書名稱 | Advances in Computer Vision and Machine Intelligence | | 圖書封面 |  | | 描述 | DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep- tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure- ment), vision systems are still not found frequently in today‘s electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en- gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac- tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their cont | | 出版日期 | Book 1990 | | 關(guān)鍵詞 | Sensor; Signal; Wafer; algorithms; circuit; complexity; computer; computer vision; electronics; image process | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4613-0507-1 | | isbn_softcover | 978-1-4612-7841-2 | | isbn_ebook | 978-1-4613-0507-1 | | copyright | Plenum Press, New York 1990 |
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