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Titlebook: Compendium of Surface and Interface Analysis; The Surface Science Society of Japan Book 2018 Springer Nature Singapore Pte Ltd. 2018 Surfa

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樓主: 稀少
21#
發(fā)表于 2025-3-25 04:03:17 | 只看該作者
Acoustic Microscopy,Biological ultrasonic microscopy, also known as biological scanning acoustic microscope, provides quantitative acoustic parameters like sound speed and characteristic acoustic impedance that are relevant to elastic properties.
22#
發(fā)表于 2025-3-25 08:40:37 | 只看該作者
23#
發(fā)表于 2025-3-25 13:57:07 | 只看該作者
Ambient Pressure X-Ray Photoelectron Spectroscopy,X-ray photoelectron spectroscopy (XPS) is one of most thoroughly used surface science techniques, which provides information on chemical states of both adsorbates and substrates on the basis of core-level shifts of photoelectrons excited primarily with X-rays.
24#
發(fā)表于 2025-3-25 17:12:18 | 只看該作者
25#
發(fā)表于 2025-3-25 22:18:11 | 只看該作者
Atom Probe Field Ion Microscope,A high electric field of greater than 0.5?V/? can be generated over the apex of a sharpened metallic needle (tip) with a radius of less than 100?nm, by application of a voltage of higher than a few kV to the tip.
26#
發(fā)表于 2025-3-26 02:05:52 | 只看該作者
Atomic Force Microscope,AFM was developed to overcome a drawback of scanning tunneling microscopy (STM), which can only image conducting surfaces.
27#
發(fā)表于 2025-3-26 07:17:28 | 只看該作者
Auger Electron Spectroscopy,As each element carries unique values of core-level binding energies, ., this has enabled the development of numerous elemental composition analysis methods based on core electron excitation.
28#
發(fā)表于 2025-3-26 08:52:24 | 只看該作者
Cathodoluminescence,Cathodoluminescence is a light emission according to an electron beam injection.
29#
發(fā)表于 2025-3-26 16:36:58 | 只看該作者
Differential Interference Contrast Microscopy/Phase-Contrast Microscopy,A specimen that has an even magnitude of reflectivity all over the surface is called a phase object.
30#
發(fā)表于 2025-3-26 17:37:08 | 只看該作者
Dynamic Secondary Ion Mass Spectrometry,Ion beam bombardment with energy of less than a few tens of kiloelectron volts (primary ion bombardment) onto the sample surface causes sputtering phenomena following cascade mixing in the near-surface of the sample.
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