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Titlebook: Closing the Gap Between ASIC & Custom; Tools and Techniques David Chinnery,Kurt Keutzer Book 2002 Springer Science+Business Media New York

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發(fā)表于 2025-3-21 17:37:03 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Closing the Gap Between ASIC & Custom
副標(biāo)題Tools and Techniques
編輯David Chinnery,Kurt Keutzer
視頻videohttp://file.papertrans.cn/229/228374/228374.mp4
圖書(shū)封面Titlebook: Closing the Gap Between ASIC & Custom; Tools and Techniques David Chinnery,Kurt Keutzer Book 2002 Springer Science+Business Media New York
描述by Kurt Keutzer Those looking for a quick overview of the book should fast-forward to the Introduction in Chapter 1. What follows is a personal account of the creation of this book. The challenge from Earl Killian, formerly an architect of the MIPS processors and at that time Chief Architect at Tensilica, was to explain the significant performance gap between ASICs and custom circuits designed in the same process generation. The relevance of the challenge was amplified shortly thereafter by Andy Bechtolsheim, founder of Sun Microsystems and ubiquitous investor in the EDA industry. At a dinner talk at the 1999 International Symposium on Physical Design, Andy stated that the greatest near-term opportunity in CAD was to develop tools to bring the performance of ASIC circuits closer to that of custom designs. There seemed to be some synchronicity that two individuals so different in concern and character would be pre-occupied with the same problem. Intrigued by Earl and Andy’s comments, the game was afoot. Earl Killian and other veterans of microprocessor design were helpful with clues as to the sources of the performance discrepancy: layout, circuit design, clocking methodology, and d
出版日期Book 2002
關(guān)鍵詞ASIC; Flip-Flop; Standard; architecture; integrated circuit; layout; logic; microprocessor; optimization; tra
版次1
doihttps://doi.org/10.1007/b105287
isbn_softcover978-1-4757-7624-9
isbn_ebook978-0-306-47823-9
copyrightSpringer Science+Business Media New York 2002
The information of publication is updating

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Faster and Lower Power Cell-Based Designs with Transistor-Level Cell Sizingign, the PPO flow delivers higher performance and reduces the power consumption of cell-based designs. By offering more optimization than traditional cell-based designs, PPO is especially well suited for semi-custom designs and hard IP development, where high performance and/or low power are critica
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Design Optimization with Automated Flex-Cell Creationl design information, need to be addressed. Preliminary results using flex-cell based optimization suggest that when employed properly, this methodology holds promise of significant benefit to the process of optimizing automatically created digital designs.
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Exploiting Structure and Managing Wires to Increase Density and Performance1.6 for density with only modest additional effort. The underlying theme of our approach is to identify critical components of a design and judiciously employ custom techniques only on these few pieces to maximize quality while minimizing effort.
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Increasing Circuit Performance through Statistical Design Techniquescess-related) and environmental (temperature, .). Fundamentally, as long as ASIC designers cannot tolerate any parametric yield loss, they will have to live with the fact that the same design may have run, on average, 20–30% faster, and sometimes, 40–50% faster..Still, ASIC designers may win back so
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,Ausgeführte Schiffs-?lmaschinenanlagen,tching noise. With increasingly design margins, logic and clock can no longer be designed separately—simultaneous clock skew optimization and gate sizing will become common practice in ASIC design in the near future.
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Umweltschutz in der Seeschifffahrt,l design information, need to be addressed. Preliminary results using flex-cell based optimization suggest that when employed properly, this methodology holds promise of significant benefit to the process of optimizing automatically created digital designs.
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Schiffsbetriebsanlagen/Hilfssysteme,cess-related) and environmental (temperature, .). Fundamentally, as long as ASIC designers cannot tolerate any parametric yield loss, they will have to live with the fact that the same design may have run, on average, 20–30% faster, and sometimes, 40–50% faster..Still, ASIC designers may win back so
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