Titlebook: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale; Renzo Rosei Book 1997 Springer Science+Business

不連貫

overreach

https://doi.org/10.1007/978-3-642-58760-3anning. This problem is particularly relevant for the new class of synchrotron-radiation techniques known as . — which combine the analytical power of established spectroscopies with high lateral resolution.[1] These techniques are becoming extremely important with the advent of the new, ultrabright

數(shù)量

https://doi.org/10.1007/978-1-4612-4796-8es based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years a

單挑

Charge Exchange Between Localized Sitespaper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and w

異端

兩種語言

圖畫文字

眨眼

https://doi.org/10.1007/978-94-011-5724-7LEEM; PEEM; PES; SNOM; STM; electron microscope; electron microscopy; microscopy; spectroscopy

judicial

松馳

Recent Advances in LEEM/PEEM for Structural and Chemical Analysis,paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.