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Titlebook: Characterization of Microstructures by Analytical Electron Microscopy (AEM); Yonghua Rong Book 2012Latest edition Higher Education Press,

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發(fā)表于 2025-3-21 19:51:14 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Characterization of Microstructures by Analytical Electron Microscopy (AEM)
編輯Yonghua Rong
視頻videohttp://file.papertrans.cn/224/223992/223992.mp4
概述Comprehensive introduction to Analytical Electron Microscopy with examples from Materials Science.Covers all aspects from theory to applications in the laboratory.First complete treatment of the subje
圖書(shū)封面Titlebook: Characterization of Microstructures by Analytical Electron Microscopy (AEM); Yonghua Rong Book 2012Latest edition Higher Education Press,
描述"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
出版日期Book 2012Latest edition
關(guān)鍵詞AEM; Analytical electron microscopy; Electron diffraction; HEP; Imaging; Martensite; Steel; TEM; Transmissio
版次1
doihttps://doi.org/10.1007/978-3-642-20119-6
copyrightHigher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012
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沙發(fā)
發(fā)表于 2025-3-22 00:14:41 | 只看該作者
Characterization of Microstructures by Analytical Electron Microscopy (AEM)
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發(fā)表于 2025-3-22 01:27:31 | 只看該作者
Specimen Preparation,icrotome for sectioning biological materials, polymer and extended to a specimen consisting of particles and fibers; FIB instrument can be used to both ion beam image and specimen preparation with precise location in an initial bulk material.
地板
發(fā)表于 2025-3-22 08:38:32 | 只看該作者
Mathematics Analysis in Electron Diffraction and Crystallography,ain model, O-line model. In order to understand the systematic extinction in electron diffraction caused by crystallographic symmetries, firstly basic knowledges of crystallography are briefly introduced, such as macro-symmetry elements and their combination laws, point groups, space groups, equival
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https://doi.org/10.1007/978-1-4302-1056-6ain model, O-line model. In order to understand the systematic extinction in electron diffraction caused by crystallographic symmetries, firstly basic knowledges of crystallography are briefly introduced, such as macro-symmetry elements and their combination laws, point groups, space groups, equival
7#
發(fā)表于 2025-3-22 19:12:41 | 只看該作者
https://doi.org/10.1007/978-3-642-20119-6AEM; Analytical electron microscopy; Electron diffraction; HEP; Imaging; Martensite; Steel; TEM; Transmissio
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發(fā)表于 2025-3-22 21:46:47 | 只看該作者
Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012
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