Titlebook: Built-in-Self-Test and Digital Self-Calibration for RF SoCs; Sleiman Bou-Sleiman,Mohammed Ismail Book 2012 Springer Science+Business Media

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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

歪曲道理

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Built-in-Self-Test and Digital Self-Calibration for RF SoCs978-1-4419-9548-3Series ISSN 2191-8112 Series E-ISSN 2191-8120

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2191-8112 on-chip testing capabilities as well as on-the-fly calibratiThis book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circu

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2191-8112 ill result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.?978-1-4419-9547-6978-1-4419-9548-3Series ISSN 2191-8112 Series E-ISSN 2191-8120

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