Titlebook: Boundary-Scan Test; A Practical Approach Harry Bleeker,Peter Eijnden,Frans Jong Book 1993 Springer Science+Business Media Dordrecht 1993 Ha

digestive-tract

書目名稱Boundary-Scan Test影響因子(影響力)




書目名稱Boundary-Scan Test影響因子(影響力)學(xué)科排名




書目名稱Boundary-Scan Test網(wǎng)絡(luò)公開度




書目名稱Boundary-Scan Test網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Boundary-Scan Test被引頻次




書目名稱Boundary-Scan Test被引頻次學(xué)科排名




書目名稱Boundary-Scan Test年度引用




書目名稱Boundary-Scan Test年度引用學(xué)科排名




書目名稱Boundary-Scan Test讀者反饋




書目名稱Boundary-Scan Test讀者反饋學(xué)科排名

愛哭

taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.978-1-4613-6371-2978-1-4615-3132-6

廣告

檢查

oblique

https://doi.org/10.1007/978-3-540-32753-0m in a following section. By searching the minimum test vector set for memory interconnect tests, it is proven that BST is an excellent tool for these type of tests as well. In the last section an architecture of a Boundary-Scan test flow is given.

水槽

吞下

vasculitis

Ingenuity

野蠻

BST Design Languages,can applications in various phases of the product life cycle, where ‘product’ may be defined as IC, PCB or system. Table 4-1 intends to place the various tools in their right context, which may be useful when reading this chapter.