Titlebook: BiCMOS Technology and Applications; A. R. Alvarez Book 1993Latest edition Springer Science+Business Media New York 1993 CMOS.Standard.anal

Indurate

Muscularis

Process Reliability,ity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process ar

工作

Engulf

BiCMOS Standard Memories,n and area have been regarded as the theoretical indications for technology performance and density. In a similar manner memory access time, memory power dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard sti

悲觀

Testing,tudies have shown that today test can easily account for onethird of development effort but test-escapes still account for 30% of all defective devices removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology

TIGER

Analog Design,grated circuits evolved from the bipolar technologies with vertical . transistors and lateral . transistors. While bipolar analog integrated circuits continued to develop, NMOS technologies were becoming popular in digital integrated circuits for their high packing density. For analog applications,

Bernstein-test

CAD Methods for BiCMOS Design, design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.

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