SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影響因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE

紅潤

小隔間

CORE

Submitted on: 20 February 2008. Revised on: 23 May 2008. Accepted on: 18 June 2008. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

SPALL

Submitted on: 05 February 2017. Revised on: 09 March 2017. Accepted on: 22 April 2017. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

翅膀拍動(dòng)

Submitted on: 20 October 2024. Revised on: 30 January 2025. Accepted on: 25 February 2025. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Liability

粗魯性質(zhì)

Submitted on: 29 May 1999. Revised on: 26 June 1999. Accepted on: 24 July 1999. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

delta-waves

檢查

Submitted on: 18 May 2020. Revised on: 02 August 2020. Accepted on: 13 August 2020. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

paltry

Submitted on: 22 April 2013. Revised on: 17 August 2013. Accepted on: 01 October 2013. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS