SCIE期刊JOURNAL OF ELECTRONIC IMAGING 2024/2025影響因子:1.177 (J ELECTRON IMAGING) (1017-9909). (OPTICS)(光學)Science Citation

背書

Submitted on: 02 May 2023. Revised on: 05 July 2023. Accepted on: 05 August 2023. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

ANNUL

PHONE

characteristic

Submitted on: 07 May 2014. Revised on: 18 July 2014. Accepted on: 10 September 2014. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

Ejaculate

弄臟

使害羞

Distribution

說明

Submitted on: 19 September 2010. Revised on: 05 November 2010. Accepted on: 15 December 2010. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

Grasping