Titlebook: Atomic Force Microscopy; Bert Voigtl?nder Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te

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Studies in Computational IntelligenceDue to the interaction between tip and the surface, the resonance frequency of the cantilever changes. As shown in this chapter, an attractive force between tip and sample leads to a lower resonance frequency of the cantilever, while for repulsive tip-sample forces the resonance frequency increases.

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Frumen Olivas,Fevrier Valdez,Oscar Castillomages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.

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https://doi.org/10.1007/978-981-10-3120-5he topography signal on the sample to be measured. If atomic steps are imaged, the noise should have an amplitude much smaller than 1??. In the following we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or du

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