| 期刊全稱 | Applied Scanning Probe Methods XII | | 期刊簡稱 | Characterization | | 影響因子2023 | Bharat Bhushan,Harald Fuchs | | 視頻video | http://file.papertrans.cn/161/160126/160126.mp4 | | 發(fā)行地址 | First book summarizing the state of the art of this technique.Real industrial applications included.Includes supplementary material: | | 學(xué)科分類 | NanoScience and Technology | | 圖書封面 |  | | 影響因子 | Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface | | Pindex | Book 2009 |
The information of publication is updating
|
|
|Archiver|手機(jī)版|小黑屋|
派博傳思國際
( 京公網(wǎng)安備110108008328)
GMT+8, 2026-1-22 13:46
發(fā)表于 2025-3-21 17:02:58
