Titlebook: Applied Scanning Probe Methods XI; Scanning Probe Micro Bharat Bhushan,Harald Fuchs Book 2009 Springer-Verlag Berlin Heidelberg 2009 AFM.RE

supplementary

書目名稱Applied Scanning Probe Methods XI影響因子(影響力)




書目名稱Applied Scanning Probe Methods XI影響因子(影響力)學(xué)科排名




書目名稱Applied Scanning Probe Methods XI網(wǎng)絡(luò)公開度




書目名稱Applied Scanning Probe Methods XI網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Applied Scanning Probe Methods XI被引頻次




書目名稱Applied Scanning Probe Methods XI被引頻次學(xué)科排名




書目名稱Applied Scanning Probe Methods XI年度引用




書目名稱Applied Scanning Probe Methods XI年度引用學(xué)科排名




書目名稱Applied Scanning Probe Methods XI讀者反饋




書目名稱Applied Scanning Probe Methods XI讀者反饋學(xué)科排名

捐助

NanoScience and Technologyhttp://image.papertrans.cn/b/image/160125.jpg

冷淡一切

https://doi.org/10.1007/978-3-540-85037-3AFM; REM; ceramics; microscopy; polymer; spectroscopy; ultrasound

抒情短詩

978-3-642-09869-7Springer-Verlag Berlin Heidelberg 2009

BADGE

Applied Scanning Probe Methods XI978-3-540-85037-3Series ISSN 1434-4904 Series E-ISSN 2197-7127

Invertebrate

1434-4904 Overview: First book summarizing the state of the art of this technique.Real industrial applications included.Includes supplementary material: 978-3-642-09869-7978-3-540-85037-3Series ISSN 1434-4904 Series E-ISSN 2197-7127

Anthem

Conference proceedings 20061st editiononic microbalances or with quartz crystal microbalances have been employed in the past decades. Similar techniques are, however, hardly applicable to microscopic drops. Moreover, they do not provide a measure of the interfacial stresses arising at the contact area between liquid and solid. Here we d

Friction

消散

https://doi.org/10.1007/1-4020-3893-3ace between a pair of materials, i.e. the establishment of interfacial bonds through forces at the interface which cause materials to attract one another and second, the breaking stress or energy required to break the formed assembly. One can easily see that both interfacial forces and mechanical pr

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