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Titlebook: Applied Scanning Probe Methods V; Scanning Probe Micro Bharat Bhushan,Satoshi Kawata,Harald Fuchs Book 2007 Springer-Verlag Berlin Heidelbe

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發(fā)表于 2025-3-21 16:51:59 | 只看該作者 |倒序瀏覽 |閱讀模式
期刊全稱Applied Scanning Probe Methods V
期刊簡稱Scanning Probe Micro
影響因子2023Bharat Bhushan,Satoshi Kawata,Harald Fuchs
視頻videohttp://file.papertrans.cn/161/160120/160120.mp4
發(fā)行地址First book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material:
學科分類NanoScience and Technology
圖書封面Titlebook: Applied Scanning Probe Methods V; Scanning Probe Micro Bharat Bhushan,Satoshi Kawata,Harald Fuchs Book 2007 Springer-Verlag Berlin Heidelbe
影響因子The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an
Pindex Book 2007
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Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy,mic mode. In dynamic AFM mode, a cantilever is driven to vibrate by its holder or the sample. The changes of cantilever vibration parameters (amplitude, resonance frequency, and phase angle) due to tip-sample interaction are used to reveal surface properties. Analytical and numerical models that can
地板
發(fā)表于 2025-3-22 07:35:37 | 只看該作者
Near-Field Raman Spectroscopy and Imaging,e detection and identification, on the other hand, is a matter of ongoing active research. Raman spectroscopy can provide unambiguous molecular identification due to the welldefined vibrational energy peaks. However, in order to develop all its potential in nanotechnologies, a spatial resolution bey
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Environmental Toxicity and Evaluation due to both the enhanced excitation fields and the exploitation of metal-induced resonant electronic levels. Although the physical and chemical mechanisms underlying these phenomena are not yet fully understood, single-molecule sensitivity and sub-20 nm spatial resolution Raman imaging have been demonstrated.
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1434-4904 nning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are p
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發(fā)表于 2025-3-22 22:10:52 | 只看該作者
Book 2007chnical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories w
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發(fā)表于 2025-3-23 02:57:19 | 只看該作者
High-Frequency Dynamic Force Microscopy,tion of high-frequency DFM and small and stiff cantilevers allows a wider range of imaging parameters to be chosen, resulting in higher resolution and the choice of interaction between the tip and the sample, and represents the future of DFM.
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發(fā)表于 2025-3-23 07:35:40 | 只看該作者
Environmental Responses in Plantstion of high-frequency DFM and small and stiff cantilevers allows a wider range of imaging parameters to be chosen, resulting in higher resolution and the choice of interaction between the tip and the sample, and represents the future of DFM.
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