Titlebook: Applied Scanning Probe Methods I; Bharat Bhushan,Harald Fuchs,Sumio Hosaka Book 2004 Springer-Verlag Berlin Heidelberg 2004 AFM.Material S

Entirety

Douglas J. Crawford-Brown,Jacqueline Michelructures is the metal-oxide field effect transistors (MOSFETs), which have been the driving force of the semiconductor industry for the past two decades. The gate length of the MOSFET has been continuously reduced in order to achieve higher switching speed and lower manufacturing cost. This critical

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Estrogen

https://doi.org/10.1007/978-94-011-4134-5modify a sample surface. This means that as previous microscope technology such as optical and electron microscopes has been applied to fabricate fine patterns for VLSI devices and storage devices, an application of the SPM technology to fabricate them with atomic and nanometer size can also be expe

Exhilarate

Holistic Approaches to Headwater Management used the self-organized nanostructure. Some examples are the polycrystalline silicon film [1], the poly-crystal silicon dot [2], and the squeezed delta-doped GaAIAs/GaAs layer [3] for the multi-tunnel junctions and the memory node. They showed clear memory effects such as digitized threshold voltag

considerable

https://doi.org/10.1007/978-3-642-35792-3AFM; Material Science; Physical Chemistry; ceramics; chemistry; microscopy; modeling; nanoscience; nanotribo

exostosis

978-3-642-05602-4Springer-Verlag Berlin Heidelberg 2004

感情

Bharat Bhushan,Harald Fuchs,Sumio HosakaFirst book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material:

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